ADVANCED NANOSCALE TESTING SOLUTIONS
We invite you to attend a seminar on nanoscale
thin film material and semiconductor device characterization.
Date: Tuesday, 15th January 2019
Time: 12:00-1:00pm (EST)
Location: Cornell University, Room 340 Duffield Hall
RSVP by Friday, 11 January 2019
Complementary lunch will be served for those who RSVP!
This presentation will focus on Xallent’s research and development efforts toward the commercialization of innovative nanomachines and probe stations for structural and electrical characterization of thin film materials and semiconductor devices. We will introduce the DARIUS Nanoprober for next generation thin film and semiconductor test applications. The DARIUS Nanoprober enables sheet resistance measurements in thin films and semiconductor production applications in ambient or vacuum, for samples with minimum sizes of 200 nm by 4.0 µm. With its low profile, fast setup and minimized sample preparation requirement, the DARIUS Nanoprober offers simple, fast and reliable characterization in many thin film and semiconductor test requirements.
Presenter: Dr. Kwame Amponsah is the CEO & Founder of Xallent LLC, based in Ithaca, NY. He serves as a principal investigator for Defense Advanced Research Projects Agency (DARPA) and National Science Foundation (NSF) on projects of national interest. He obtained his BS, MEng, MS and PhD degrees in Electrical and Computer Engineering from Cornell University, and in 2010, he received IEEE’s best student paper award at the Nano/Micro Engineered and Molecular Systems conference in China for his work on NEMS switches. In his free time, he enjoys listening to music and reading novels.