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SPIE Handbook of Microlithography, Micromachining and MicrofabricationVolume 1: Microlithography2.8 AcknowledgementsTable of Contents 2.8 AcknowledgementsThe authors would like to thank the many people who helped in the editing, proofreading, and checking of this chapter; primarily the SPIE reviewer and copy editor, and including also Sylvia Chanak (Cadence), Dennis Costello (Cornell), Mark Gesley (Etec), George Lanzarotta (Raith), Alex Liddle (Lucent), Francois Marquis (Design Workshop), Beth Moseley (Hitachi), Joseph Nabity (Nabity Lithography Systems), Yasutoshi Nakagawa (JEOL), Hans Pfeiffer (IBM), Rainer Plontke (Leica Jena), John Poreda (Lepton), and Bernard Wallman (Leica).
Table of Contents Please send us your comments, corrections, and submissions. Order the complete book from SPIE Back to Top |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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