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Baseline Process Data from CNF Fellows

Lithography

    Thin Film Deposition, Synthesis and Processing

    Characterization

    Process Integration

    Modeling and Simulation



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    		Cornell University
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    This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

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