![]() ![]() ![]() ![]() |
![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() |
|
|
![]() |
|
|
|
|
||
|
|
Veeco Ion Mill
Ion milling system for physical sputter etching of substrates
Manager: Jerry Drumheller
Description:The vacuum system is Cryo pumped, and equiped with a water cooled substrate stage which can tilt up to 90 degrees, and rotate the wafer. A 10 cm Kaufman Argon Ion beam source is used to sputter etch substrates up to 4 inch diameter. Small pieces are also easily used. Patterned etching can be done with hard masks, or very carefully with a photoresist mask. Relative removal rates for different materials are generally proportional to published sputter yield rates. Back to Top |
|
|
||||||||||||
|
|
|||
|
|
![]() ![]()
|
||
|
|
This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
||