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CNF Lab and Equipment Information
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5X g-line Stepper
CAC Name: 5X GCA 6300 DSW Projection Mask Aligner, 5X g-line Stepper
Manager: Edward Camacho
Backup: Garry Bordonaro
Equipment Training
Stepper training is done with groups of users and consists of two parts: classroom lecture and cleanroom demonstration. The entire session lasts up to 3 hrs. for large groups. This training assumes prior knowledge of or experience in photolithography; viewing the Nanocourse Photolithography video sections is a minimum requirement: http://www.cnfusers.cornell.edu/cnf5_courses.html
There are no training sessions currently scheduled.
Description:This projection printer uses a g-line (436nm) lens column ( 0.30 N.A.) to provide a 5:1 reduction with a variable field size up to 15mm square. Minimum feature size is <0.9µm. The number and placement of the dies is programmable. Wafer size of 3" up to 150mm can be accommodated, as well as smaller pieces. A customized hand-held chuck system allows rapid change of substrate size. Registered alignment is typically <0.25µm. 5" x 0.090"-thick masks are used. This instrument can be easily converted to function as a GCA 3696 Photorepeater system for exposing photoresist coated glass plates up to 7". Capabilities:
Additional Resources:Equipment Information SheetAlignment Mark GDS File Fiducial Mark GDS File GCA Stepper Operation Notes 5X Resist Matrix Back to Top |
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PHOTOLITHOGRAPHY
5X g-line Stepper ABM Contact Aligner ASML 300C DUV Stepper Autostep i-line Stepper EV620 Contact Aligner Fusion UV Cure Gamma Automatic Coat-Develop Tool Hamatech-Steag Mask Processors Hamatech-Steag Wafer Processors Heidelberg Mask Writer DWL2000 JBA 1000 Photoresist UV Cure Karl Suss RC-8 Manual Resist Spinners Nanoimprint NX-2500 PG Mask Writer Resist Hot Strip Bath SU-8 Hotplates Suss MA6-BA6 Contact Aligner YES Image Reversal Oven YES Polymide Bake Oven YES Vapor Prime Oven Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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