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SEMS / MICROSCOPES
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Olympus Confocal Microscope
Olympus BX60/U-CFU Real Time Confocal Microscope 
Manager: Alan R. Bleier
Backup: Garry Bordonaro
Description:The Olympus BX60/U-CFU microscope employs a newly developed slit method scanning disk that blocks defocused reflected light from samples and allows only focused light to go through. It generates clear and high resolving images with 0.18-micron compatibility. A mercury lamp house is the standard light source, which provides a bright, clear image. The U-CFU has excellent Z-axis (vertical) detection. A layer in a multi-layer wafer can be observed distinguishably through this capability. (Photo below is linked to 300 dpi version.) Additional Resources:Equipment Information SheetResults:
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SEMS / MICROSCOPES
AFM - DI3100 AFM - Veeco Icon BX51 Fluorescence Microscope Focused Ion Beam - Hitachi FB-2000A Hitachi S-900 Nikon Eclipse L200N and Other Optical Inspection Microscopes Nikon Microscope Cameras Olympus Confocal Microscope SEM Sample Prep Sputtering System Zeiss Supra SEM Zeiss Ultra SEM Zyvex Nanoprobes for Ultra SEM Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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