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CNF Lab and Equipment Information
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SEM Sample Prep Sputtering System
Small chamber sputtering systems for coating SEM samples 
Manager: Jerry Drumheller
Backup: Aaron Windsor
Description:The CNF has two small sputter systems for coating samples prior to SEM imaging or electron beam lithography. One machine is setup for Gold while the other system is setup for Gold / Palladium. The manual machines allow for quick coating of conductive films to assist in electron beam work. Additional Resources:Equipment Information SheetBack to Top |
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Missing SEM chucks
May 14, 2013 A 4" wafer holder and single stub holder are missing from the SEMs. If you have taken one or both of these then please return them. 
SEMS / MICROSCOPES
AFM - DI3100 AFM - Veeco Icon BX51 Fluorescence Microscope Focused Ion Beam - Hitachi FB-2000A Hitachi S-900 Nikon Eclipse L200N and Other Optical Inspection Microscopes Nikon Microscope Cameras Olympus Confocal Microscope SEM Sample Prep Sputtering System Zeiss Supra SEM Zeiss Ultra SEM Zyvex Nanoprobes for Ultra SEM Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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