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CNF Lab and Equipment Information
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Zygo Optical Profilometer
CAC Name: Zygo NewView 7300 noncontact surface height measurement system 
Manager: Daron Westly
Backup: Rob Ilic
Equipment Training
Please contact the tool manager to arrange a training session. Description:The NewView 7300 is a non-contact optical profilometer capable of producing highly accurate, 3D surface topography measurements. The 7300 rapidly measures heights from less than 1 micron up to 20 millimeters, with vertical resolution to 0.1 nm. It is ideally suited for inspecting step heights, MEMS devices, and many other applications. With the stitching option large areas can be measured and combined to form one image. It also has a stroboscopic measurement capability which will takes movies of moving structures like comb drives and oscillators. Capabilities:
Additional Resources:Equipment Information SheetBack to Top |
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METROLOGY
Alpha Step 200 CDE ResMap Resistivity 4-pt Probe FilMetrics Film Measurement Systems FleXus Film Stress Measurement Leitz Film Measurement P10 Profilometer Soft Materials 4-point Probe VCA Optima Contact Angle Woollam Spectroscopic Ellipsometer Zygo Optical Profilometer Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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