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CNF Lab and Equipment Information
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Alpha Step 200
AlphaStep 200 surface profiler 
Manager: Rob Ilic
Backup: Michael Skvarla
Description:The AlphaStep 200 computerized surface profiler auto-levels and auto-scales step heights up to 160 kA in the kA mode or up to 160 µm in the µm mode, with scan lengths up to 1 cm. The system is good for quick scans of single steps. More complex topographies should be measured on the Tencor P-10. Back to Top |
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METROLOGY
Alpha Step 200 CDE ResMap Resistivity 4-pt Probe FilMetrics Film Measurement Systems FleXus Film Stress Measurement Leitz Film Measurement P10 Profilometer Soft Materials 4-point Probe VCA Optima Contact Angle Woollam Spectroscopic Ellipsometer Zygo Optical Profilometer Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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