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CNF Lab and Equipment Information
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CDE ResMap Resistivity 4-pt Probe
CAC Name: CDE Automatic 4 point probe resitivity mapper 
Manager: Phil Infante
Equipment Training
Contact staff for training on this equipment. Description:The CDE resistivity mapper is a 4 point probe system with an automatic stage. It can be used to measure the surface resistivity of thin films or with calibration, the thickness and uniformity of conductive thin films. Additional Resources:Equipment Information SheetBack to Top |
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METROLOGY
Alpha Step 200 CDE ResMap Resistivity 4-pt Probe FilMetrics Film Measurement Systems FleXus Film Stress Measurement Leitz Film Measurement P10 Profilometer Soft Materials 4-point Probe VCA Optima Contact Angle Woollam Spectroscopic Ellipsometer Zygo Optical Profilometer Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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