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CDE ResMap Resistivity 4-pt Probe

Automatic 4 point probe resitivity mapper

CDE Resitivity Mapper
Manager: Phil Infante

Description:

The CDE resistivity mapper is a 4 point probe system with an automatic stage. It can be used to measure the surface resistivity of thin films or with calibration, the thickness and uniformity of conductive thin films.




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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
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