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IV Probe Station

I-V Measurement Systems

Manager: Phil Infante

Description:

This system consists of 4 high precision Source measurement units (SMUs) and additional electronics for bias and triggering. The system is controlled by user friendly PC software. The system is coupled to a Karl Suss PSM6 Submicron prober with B&L Microzoon optics. A ultrasonic cutter probe is also available. The system electronics were donated in 1993 by Keithley Instruments for support of the CNF User Program.




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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu
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