Accurion EP3 Imaging Ellipsometer
Imaging Ellipsometer for Optical Characterization of Thin Films
Manager: Xinwei WuBackup: Jeremy Clark , Beth Rhoades
The ellipsometer uses a nondestructive (noncontact) optical method to determine film thickness and optical properties. It measures thin films and almost any material deposited on a substrate. This might include thin metal films, oxides, organic coatings, or biological molecule layers such as DNA. While ellipsometry was originally a technique for macroanalysis, this device combines original technology with polarization contrast microscopy to give it the capacity to perform microanalysis.
Additional Resources:Tool Manual
Thin Film analysis software instructions
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This material is based upon work supported by the National Science Foundation under Grant No. ECCS-1542081. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
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