Bruker (Veeco) Dektak 6M profilometer
Tool for measuring step heights and surface roughness
Manager: Jeremy ClarkBackup: Xinwei Wu
Profilometry allows users to get a 2D trace of surface topographic features through contact with a stylus. The Dektak profilometer determines film thickness, feature heights in microfluidic devices, 3D-printed devices or feature depths in laser cut samples. It can also show the surface roughness of substrates.
Additional Resources:Tool manual
Tips for measuring soft elastomer substrates
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This material is based upon work supported by the National Science Foundation under Grant No. ECCS-1542081. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
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