CNF Lab and Equipment Information
CAC Name: P7
Micro contact method for measuring surface topology on a nanometer or micron scale.
Manager: Jerry DrumhellerBackup: Jeremy Clark , Beth Rhoades
A profilometer is a precision metrology tool used to measure surface characteristics in the micron to nanometer scale. It is an ideal tool for measuring step heights. This is useful for measuring film thickness, etch depth, surface roughness, wear-scar measurements. Many parameters of surface roughness and waviness can be measured. The P-7 is a stylus-based surface profiler, with motorized XY stage with vacuum hold down, and a wide range of scan parameter settings.
Additional Resources:Equipment Information Sheet
Back to Top
Accurion EP3 Imaging Ellipsometer
Alpha Step 200
Bruker (Veeco) Dektak 6M profilometer
CDE ResMap Resistivity 4-pt Probe
FilMetrics Film Measurement Systems
FleXus Film Stress Measurement
Leitz Film Measurement
Malvern Nano ZS Zetasizer
Malvern NS300 NanoSight
Metricon Model 2010/M Prism Coupler
Schott IR Inspector
Soft materials 4-pt probe (2nd fl.)
VCA Optima Contact Angle
Woollam Spectroscopic Ellipsometer
Zygo Optical Profilometer
Back to Equipment List
This material is based upon work supported by the National Science Foundation under Grant No. ECCS-1542081. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.
If you have a disability and are having trouble accessing information on this website or need materials in an alternate format, contact email@example.com for assistance.
Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: firstname.lastname@example.org
Powered by ITX