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CNF Lab and Equipment Information
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Hitachi S-900
CAC Name: S900 SEM Hitachi electron microscope in room 228 Manager: Alan R. Bleier
Backup: Donald Tennant
, Daron Westly
Description:Capabilities:Processes Available:Applications:Back to Top |
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Missing SEM chucks
May 14, 2013 A 4" wafer holder and single stub holder are missing from the SEMs. If you have taken one or both of these then please return them. 
SEMS / MICROSCOPES
AFM - DI3100 AFM - Veeco Icon BX51 Fluorescence Microscope Focused Ion Beam - Hitachi FB-2000A Hitachi S-900 Nikon Eclipse L200N and Other Optical Inspection Microscopes Nikon Microscope Cameras Olympus Confocal Microscope SEM Sample Prep Sputtering System Zeiss Supra SEM Zeiss Ultra SEM Zyvex Nanoprobes for Ultra SEM Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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