CNF - Lab and Equipment Information - Soft Materials 4-point Probe

METROLOGY

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Soft Materials 4-point Probe

Manual probe station- lab 228 Duffield Hall

Manager: Phil Infante

Backup: Phil Infante

Equipment Training
Contact tool manager for training.

Description:

A Lucas Signatone SP4 4-pt probe and a Keithley 2100 multimeter are provided for measuring the resistivity of for soft films such as conductive polymers.

Capabilities:

Probe A recommended for substrates greater than 32 mm in diameter
0.0625 in. (1.59 mm) tip spacing
45 g spring pressure (light)
Tungten Carbide tips
Blunt (0.010 in. dia.) tips
Probe B recommended for substrates greater than 20 mm in diameter
0.04 in. (1.016 mm) tip spacing
45 g spring pressure (light)
Tungten Carbide tips
Blunt (0.010 in. dia.) tips

Processes Available:

Manual measurements on the multimeter can be converted to Resistivty or conductivity using standard equations that are provided in the user manual.

Applications:

Additional Resources:

Equipment Information Sheet

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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu