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GenISys Layout BEAMER - E-beam Pattern Conversion and Proximity Correction
E-beam Pattern Conversion and Proximity Correction Manager: Rob Ilic
Description:The preparation of large layout data for e-beam direct write requires a highly efficient, flexible and robust framework for design and execution of complex processes including layout handling, processing, PEC, process modeling & correction, inspection and conversion to the machine format. Layout BEAMER is a highly intuitive, process flow driven layout processing solution. Capabilities:- VisualFLOWTM graphical user interface for drag & drop design of process flows Additional Resources:BEAMERQUICKSTART05-2010v4a.pdfBeamer Tone Reversal LayoutBeamer Manual Training Videos (Flash Required) Back to Top |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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