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Nikon Eclipse L200N and Other Optical Inspection Microscopes

Microscopes for inspection of devices

Olympus MX50
Manager: Alan R. Bleier
Backup: Garry Bordonaro
Equipment Training
Training is available now for the Nikon Eclipse L200N microscope and Nikon Elements D software for image capture. Please use the online training scheduler to sign up for training.
There are no training sessions currently scheduled.

Description:

The CNF has many optical microscopes including this Olympus MX50 for inspection of devices. Digital cameras attached to the microscopes are available for taking images of your work.

The Nikon Eclipse L200N microscope and Nikon Elements D image capture software are the best optical microscopy system at CNF.

Features include:

Motorized objective change- permits quick observation changeovers (optional hand switch is available for direct selection of objectives)
A range of observation modes - including brightfield, darkfield, (Nomarski) DIC and polarized light

The MX50 semiconductor inspection microscope was developed specifically to meet the demands of wafer inspection. It is a user-friendly microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods.

Features include:

Motorized objective change- permits quick observation changeovers (optional hand switch is available for direct selection of objectives)
A range of observation modes - including brightfield, darkfield, (Nomarski) DIC and polarized light
Magnification range- 100x to 2500x




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AFM - DI3100
AFM - Veeco Icon
BX51 Fluorescence Microscope
Focused Ion Beam - Hitachi FB-2000A
Hitachi S-900
Nikon Eclipse L200N and Other Optical Inspection Microscopes
Nikon Microscope Cameras
Olympus Confocal Microscope
SEM Sample Prep Sputtering System
Zeiss Supra SEM
Zeiss Ultra SEM
Zyvex Nanoprobes for Ultra SEM

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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu
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