CNF - Lab and Equipment Information - BX51 Fluorescence Microscope

SEMS / MICROSCOPES

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BX51 Fluorescence Microscope

CAC Name: BX51

BX51 Microscope, Sensicam Camera and Image ProPlus image software

Manager: Beth Rhoades

Backup: Alan R. Bleier

Equipment Training
No formal training required. Read the instructions that are available as "additional info" at the bottom of this page. Then contact the tool manager with any questions and to be activated as a tool user in CORAL.

Description:

The microscope and digital image capture system is located in the CNF wet (biology) lab. The microscope has light pathways for transmitted or reflected brightfield, DIC, darkfield, and fluorescence (filters for TRITC, DAPI and FITC). The stage can accommodate devices, printed materials, microfluidic apparati, and cell cultures. It is available for use with fluorescent devices, particles or cells.

The digital CCD camera (Cooke Sensicam) and image analysis software (Image ProPlus v.6.2) system is available for inspection of live images as well as documentation, manipulation and analysis of images. Capabilities include: time lapse acquisition, optical density analysis, autotrace feature, filtering with fast Fourier transformation, counting, measuring, classifying, color segmentation and calculating population density. Moving objects (particles, cells, etc.) can also be tracked and quantified.

Processes Available:

Additional Resources:

Equipment Information Sheet
Operating manual
Basic Concepts in Optical Microscopy
Basic Concepts in Fluorescence Microscopy
Image ProPlus Software analysis capabilities

Results:

Missing SEM chucks
May 14, 2013
A 4" wafer holder and single stub holder are missing from the SEMs. If you have taken one or both of these then please return them.

Notice Archive

SEMS / MICROSCOPES

AFM - DI3100
AFM - Veeco Icon
BX51 Fluorescence Microscope
Focused Ion Beam - Hitachi FB-2000A
Hitachi S-900
Nikon Eclipse L200N and Other Optical Inspection Microscopes
Nikon Microscope Cameras
Olympus Confocal Microscope
SEM Sample Prep Sputtering System
Zeiss Supra SEM
Zeiss Ultra SEM
Zyvex Nanoprobes for Ultra SEM

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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

Cornell NanoScale Science & Technology Facility (CNF)
250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu