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CNF Lab and Equipment Information

Click the tool name for detailed information.
AFM - Veeco Icon 
Veeco Icon Atomic Force Microscope for high resolution profilometry
Bruker Energy-dispersive X-ray Spectrometer (EDS) (Bruker EDS for Supra SEM)
Modular EDS system for qualitative and quantitative microanalysis.
BX-51 Fluorescence Microscope (BX51)
BX51 Microscope, Sensicam Camera and Image ProPlus image software
Focused Ion Beam - Hitachi FB-2000A (FB2000A FIB)
Tool for imaging and device modification
Hitachi S-900 (S900 SEM)
Hitachi electron microscope in room 228
JEOL 9500 Alignment Microscope 
Alignment microscope for JEOL 9500
Nikon Microscope Cameras 
Digital cameras on microscopes with stand-alone controllers
Olympus Confocal Microscope 
Olympus BX60/U-CFU Real Time Confocal Microscope
SEM Sample Prep Sputtering System 
Small chamber sputtering systems for coating SEM samples
Zeiss Supra SEM (supra)
Scanning Electron Microscope
Zeiss Ultra SEM 
Ultra High Resolution Field Emission SEM

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