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CNF Lab and Equipment Information


Click the tool name for detailed information.
SEMS / MICROSCOPES
AFM - DI3100 (AFM)
Digital Instruments Dimension 3100 Atomic Force Microscope for high resolution profilometry
AFM - Veeco Icon 
Veeco Icon Atomic Force Microscope for high resolution profilometry
BX51 Fluorescence Microscope (BX51)
BX51 Microscope, Sensicam Camera and Image ProPlus image software
Focused Ion Beam - Hitachi FB-2000A (FB2000A FIB)
Tool for imaging and device modification
Hitachi S-900 (S900 SEM)
Hitachi electron microscope in room 228
Nikon Microscope Cameras 
Digital cameras on microscopes with stand-alone controllers
Olympus Confocal Microscope 
Olympus BX60/U-CFU Real Time Confocal Microscope
SEM Sample Prep Sputtering System 
Small chamber sputtering systems for coating SEM samples
Zeiss Supra SEM (supra)
Scanning Electron Microscope
Zeiss Ultra SEM 
Ultra High Resolution Field Emission SEM
Zyvex Nanoprobes for Ultra SEM (Zyvex)
Electrical Testing and Nanomanipulation


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Missing SEM chucks
May 14, 2013
A 4" wafer holder and single stub holder are missing from the SEMs. If you have taken one or both of these then please return them.

EQUIPMENT LIST


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