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Click the tool name for detailed information.
AFM - Veeco Icon 
Veeco Icon Atomic Force Microscope for high resolution profilometry
Bruker Energy-dispersive X-ray Spectrometer (EDS) 
Modular EDS system for qualitative and quantitative microanalysis.
BX-51 Fluorescence Microscope 
BX51 Microscope, Sensicam Camera and Image ProPlus image software
Focused Ion Beam - Hitachi FB-2000A 
Tool for imaging and device modification
Hitachi S-900 
Hitachi electron microscope in room 228
JEOL 9500 Alignment Microscope 
Alignment microscope for JEOL 9500
Nikon Microscope Cameras 
Digital cameras on microscopes with stand-alone controllers
Olympus Confocal Microscope 
Olympus BX60/U-CFU Real Time Confocal Microscope
SEM Sample Prep Sputtering System 
Small chamber sputtering systems for coating SEM samples
Zeiss Supra SEM 
Scanning Electron Microscope
Zeiss Ultra SEM 
Ultra High Resolution Field Emission SEM

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