| |
| |
|
|
 |
 |
|
|
|
||
|
|
Click the tool name for detailed information.
SEMS / MICROSCOPES
AFM - DI3100
Digital Instruments Dimension 3100 Atomic Force Microscope for high resolution profilometry
AFM - Veeco Icon
Veeco Icon Atomic Force Microscope for high resolution profilometry
BX51 Fluorescence Microscope
BX51 Microscope, Sensicam Camera and Image ProPlus image software
Focused Ion Beam - Hitachi FB-2000A
Tool for imaging and device modification
Hitachi S-900
Hitachi electron microscope in room 228
Nikon Eclipse L200N and Other Optical Inspection Microscopes
Microscopes for inspection of devices
Nikon Microscope Cameras
Digital cameras on microscopes with stand-alone controllers
Olympus Confocal Microscope
Olympus BX60/U-CFU Real Time Confocal Microscope
SEM Sample Prep Sputtering System
Small chamber sputtering systems for coating SEM samples
Zeiss Supra SEM
Scanning Electron Microscope
Zeiss Ultra SEM
Ultra High Resolution Field Emission SEM
Zyvex Nanoprobes for Ultra SEM
Electrical Testing and Nanomanipulation
Back to Top |
|
|
||||||||||||
|
|||
|
|
  
|
||
|
|
This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
||
