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Click the tool name for detailed information.
SEMS / MICROSCOPES
AFM - DI3100
Digital Instruments Dimension 3100 Atomic Force Microscope for high resolution profilometry
Focused Ion Beam - FEI 611
Tool for imaging and device modification
Nikon Microscope Cameras
Digital cameras on microscopes with stand-alone controllers
Olympus Confocal Microscope
Olympus BX60/U-CFU Real Time Confocal Microscope
Olympus Fluorescence Microscope and Image Analysis System
BX51 Microscope, Sensicam Camera and Image ProPlus image software
Optical Inspection Microscopes
Microscopes for inspection of devices
SEM Sample Prep Sputtering System
Small chamber sputtering systems for coating SEM samples
Zeiss Supra SEM
Scanning Electron Microscope
Zeiss Ultra SEM
Ultra High Resolution Field Emission SEM
Zyvex S-100 Nanoprobes
Electrical Testing and Nanomanipulation
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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