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CNF Lab and Equipment Information
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Click the tool name for detailed information.
METROLOGY
Alpha Step 200
AlphaStep 200 surface profiler
CDE ResMap Resistivity 4-pt Probe (CDE)
Automatic 4 point probe resitivity mapper
FilMetrics Film Measurement Systems
F20 / F40 / F50 Optical Measurement Systems for transparent thin film measurement
FleXus Film Stress Measurement (FleXus Film Stress Measurement)
Noncontact tool for measuring film stress.
Leitz Film Measurement
Leitz Film Thickness Measurement System
P10 Profilometer (P10 Profilometer - 1 & 2)
Equipment for measuring surface topology in the micron or finer scales.
Rudolph AutoEL IV Ellipsometers
Transparent Thin Film Measurement tool
VCA Optima Contact Angle
Contact Angle Measurement Tool
Woollam Spectroscopic Ellipsometer (Woollam)
Variable Angle Ellipsometer for full optical characterization of thin films
WYKO Optical Profilometer (WYKO)
HD-3300 noncontact surface height measurement system
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METROLOGY
Alpha Step 200 CDE ResMap Resistivity 4-pt Probe FilMetrics Film Measurement Systems FleXus Film Stress Measurement Leitz Film Measurement P10 Profilometer Rudolph AutoEL IV Ellipsometers VCA Optima Contact Angle Woollam Spectroscopic Ellipsometer WYKO Optical Profilometer Back to Equipment List |
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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