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Click the tool name for detailed information.
METROLOGY
Alpha Step 200
AlphaStep 200 surface profiler
CDE ResMap Resistivity 4-pt Probe
Automatic 4 point probe resitivity mapper
FilMetrics Film Measurement Systems
F20 / F40 / F50 Optical Measurement Systems for transparent thin film measurement
FleXus Film Stress Measurement
Noncontact tool for measuring film stress.
Leitz Film Measurement
Leitz Film Thickness Measurement System
P10 Profilometer
Equipment for measuring surface topology in the micron or finer scales.
Rudolph AutoEL IV Ellipsometers
Transparent Thin Film Measurement tool
VCA Optima Contact Angle
Contact Angle Measurement Tool
Woollam Spectroscopic Ellipsometer
Variable Angle Ellipsometer for full optical characterization of thin films
WYKO Optical Profilometer
HD-3300 noncontact surface height measurement system
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This material is based upon work supported by the National Science Foundation under Grant No. ECS-0335765. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |
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