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![]() ![]() ![]() ![]() COMPUTING ELECTRICAL TESTING ELECTRON-BEAM LITHOGRAPHY ETCHING FACILITIES FURNACE PROCESSING METROLOGY PACKAGING & MISC PROCESSING PHOTOLITHOGRAPHY SEMS / MICROSCOPES THIN FILM DEPOSITION ![]() |
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![]() This material is based upon work supported by the National Science Foundation under Grant No. ECCS-1542081. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Cornell NanoScale Science & Technology Facility (CNF) 250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700 Voice: 607-255-2329, Fax: 607-255-8601, Email: information@cnf.cornell.edu Powered by ITX |